Ching-Te Chuang

Turning silicon on its edge

E. Nowak, I. Aller, Thomas Ludwig et al. · IEEE Circuits and Devices Magazine · 2004 · 387 citations

Engineering, Computer Engineering, Electrical Engineering +17

Random Dopant Fluctuation in Limited-Width FinFET Technologies

Meng‐Hsueh Chiang, Jeng-Nan Lin, Keunwoo Kim et al. · IEEE Transactions on Electron Devices · 2007 · 137 citations

Engineering, Electrical Engineering, Electronic Materials +16

Novel Cu-to-Cu Bonding With Ti Passivation at 180$^{\circ}{\rm C}$ in 3-D Integration

Yan-Pin Huang, Yu-San Chien, Ruoh-Ning Tzeng et al. · IEEE Electron Device Letters · 2013 · 110 citations

Natural Sciences, Materials Engineering, Materials Science +14

Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability

Aditya Bansal, Rahul Rao, Jae‐Joon Kim et al. · Microelectronics Reliability · 2009 · 84 citations

Engineering, Computer Engineering, Electrical Engineering +14

Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nein Chen et al. · IEEE Transactions on Electron Devices · 2013 · 76 citations

Engineering, Electrical Engineering, Interface Science +14