Ming-Long Fan

Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nein Chen et al. · IEEE Transactions on Electron Devices · 2013 · 76 citations

Engineering, Electrical Engineering, Interface Science +14

Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits

Yin-Nien Chen, Ming-Long Fan, Vita Pi‐Ho Hu et al. · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2014 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +13

Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nien Chen et al. · IEEE Transactions on Electron Devices · 2012 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +17

Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi Approach

Shao-Heng Chou, Ming-Long Fan, Pin Su · IEEE Transactions on Electron Devices · 2013 · 47 citations

Engineering, Electrical Engineering, Materials Science +17

Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs

Chien-Yu Hsieh, Ming-Long Fan, Vita Pi‐Ho Hu et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2011 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17