Pin Su

BSIM4 gate leakage model including source-drain partition

Kanyu Cao, W.-C. Lee, Wei Liu et al. · 2002 · 208 citations

Device Modeling, Electrical Engineering, Compact Mosfet Modeling +9

Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nein Chen et al. · IEEE Transactions on Electron Devices · 2013 · 75 citations

Device Modeling, Donor Trap, Electrical Engineering +11

Variability Analysis for Ferroelectric FET Nonvolatile Memories Considering Random Ferroelectric-Dielectric Phase Distribution

You-Sheng Liu, Pin Su · IEEE Electron Device Letters · 2020 · 71 citations

Spintronics, Electrical Engineering, Non-volatile Memory +13

Short-Channel Effects in 2D Negative-Capacitance Field-Effect Transistors

Wei-Xiang You, Chih-Peng Tsai, Pin Su · IEEE Transactions on Electron Devices · 2018 · 55 citations

Device Modeling, Electrical Engineering, Short-channel Effects +12

Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits

Yin-Nien Chen, Ming-Long Fan, Vita Pi‐Ho Hu et al. · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2014 · 49 citations

Low-power Electronics, Pure Tfet 8T, Electrical Engineering +13