Statistics
Publications
1
Citations
212
H-Index
1
Active since
2002
Affiliations
Intel (United States)(Current)
W.-C. Lee is an author at Intel (United States) specializing in gate leakage, gate oxide leakage, and semiconductor devices.
Publications per year
2002–2002
1
1
BSIM4 gate leakage model including source-drain partition
1–1 of 1