Yin-Nien Chen

Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nien Chen et al. · IEEE Transactions on Electron Devices · 2012 · 48 citations

Planar Bulk Devices, Electrical Engineering, Finfet Device +13

Design and Analysis of Robust Tunneling FET SRAM

Yin-Nien Chen, Ming-Long Fan, Vita Pi‐Ho Hu et al. · IEEE Transactions on Electron Devices · 2013 · 41 citations

Non-volatile Memory, Electrical Engineering, Engineering +12

Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nien Chen et al. · IEEE Transactions on Electron Devices · 2014 · 24 citations

Semiconductor Technology, Backgate-biasing Effect, Electrical Engineering +10

Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications

Ming-Long Fan, Vita Pi‐Ho Hu, Yin-Nien Chen et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 2012 · 18 citations

Device Modeling, Electrical Engineering, Variability Analysis +10

Exploration and evaluation of low-dropout linear voltage regulator with FinFET, TFET and hybrid TFET-FinFET implementations

Chia-Ning Chang, Yin-Nien Chen, Po-Tsang Huang et al. · 2017 · 14 citations

Low-power Electronics, Electrical Engineering, Engineering +11