Sufi Zafar

Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks

Sufi Zafar, Alessandro Callegari, Evgeni Gusev et al. · Journal of Applied Physics · 2003 · 309 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13

Threshold voltage instabilities in high-/spl kappa/ gate dielectric stacks

Sufi Zafar, Arvind Kumar, Evgeni Gusev et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 232 citations

Materials Engineering, Threshold Voltage Instabilities, Electrical Engineering +14

A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates

Sufi Zafar, Y. Kim, Vijay Narayanan et al. · 2006 · 200 citations

Engineering, Silicon On Insulator, Semiconductor Device +17

Ultrathin high-K gate stacks for advanced CMOS devices

E. P. Gusev, D. A. Buchanan, E. Cartier et al. · 2002 · 195 citations

Engineering, Vlsi Design, Silicon On Insulator +16

The electronic conduction mechanism in barium strontium titanate thin films

Sufi Zafar, Robert E. Jones, Bo Jiang et al. · Applied Physics Letters · 1998 · 170 citations

Materials Science, Electrical Engineering, Schottky Emission Equation +13