Evgeni Gusev

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Publications

Citations

2.1K

H-Index

Active since

1991

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

Institute of Immunology and Physiology

IBM (United States)

Ural Federal University

Qualcomm (United States)

Evgeni Gusev is an author at IBM Research - Thomas J. Watson Research Center specializing in materials science, semiconductor devices, and engineering.

ORCID

Publications per year

1991–2024

Publications

Structure and stability of ultrathin zirconium oxide layers on Si(001)

M. Copel, M. Gribelyuk, Evgeni Gusev · Applied Physics Letters · 2000 · 667 citations

Natural Sciences, Materials Engineering, Materials Science +17

Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks

Sufi Zafar, Alessandro Callegari, Evgeni Gusev et al. · Journal of Applied Physics · 2003 · 311 citations

Engineering, Electrical Engineering, Materials Science +17

Threshold voltage instabilities in high-/spl kappa/ gate dielectric stacks

Sufi Zafar, Arvind Kumar, Evgeni Gusev et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 233 citations

Engineering, Electrical Engineering, Materials Science +17

Hybrid-orientation technology (HOT): opportunities and challenges

Min Yang, V. Chan, K. Chan et al. · IEEE Transactions on Electron Devices · 2006 · 169 citations

Engineering, Electrical Engineering, Materials Science +17

High performance CMOS fabricated on hybrid substrate with different crystal orientations

Min Yang, M. Ieong, L. Shi et al. · 2004 · 90 citations

Engineering, Electrical Engineering, Microelectronics +14

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