Thermal storage effects on AlGaN/GaN HEMT

Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, A. Cetronio, C. Lanzieri, S. Lavanga, M. Peroni, P. Romanini

Microelectronics Reliability · 2008 · 15 citations · 10 references

Concepts

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