A. Cetronio

Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing

Enrico Zanoni, Francesca Danesin, Matteo Meneghini et al. · IEEE Electron Device Letters · 2009 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

Silicon carbide for high resolution X-ray detectors operating up to 100°C

G. Bertuccio, R. Casiraghi, A. Cetronio et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2004 · 78 citations

Engineering, Materials Engineering, Materials Science +14

Performance of a new ohmic contact for GaAs particle detectors

M. Alietti, C. Canali, A. Castaldini et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1995 · 71 citations

Engineering, Electrical Engineering, Physics +14

A new generation of X-ray detectors based on silicon carbide

G. Bertuccio, R. Casiraghi, A. Cetronio et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2003 · 50 citations

Engineering, Materials Science, Radiology +15

Reconstruction at a metallic interface studied by field ion and field emission microscopy

A. Cetronio, J.P. Jones · Surface Science · 1973 · 48 citations

Natural Sciences, Materials Science, Physics +15