Second-harmonic generation in silicon waveguides strained by silicon nitride

M. Cazzanelli, Federica Bianco, E. Borga, +10

Nature Materials

PhotonicsEngineeringPhysicsNon-linear OpticApplied Physics +4

Surface-Related Drain Current Dispersion Effects in AlGaN–GaN HEMTs

Gaudenzio Meneghesso, G. Verzellesi, R. Pierobon, +5

IEEE Transactions on Electron Devices

Wide-bandgap SemiconductorElectrical EngineeringEngineeringDispersion EffectsPhysics +9

Richardson’s constant in inhomogeneous silicon carbide Schottky contacts

Fabrizio Roccaforte, Francesco La Via, V. Raineri, +2

Journal of Applied Physics

SemiconductorsRoom TemperatureElectrical EngineeringElectronic DevicesEngineering +10

Performance evaluation of a Schottky SiC power diode in a boost PFC application

G. Spiazzi, Simone Buso, Massimiliano Citron, +2

IEEE Transactions on Power Electronics

Sic DiodeElectrical EngineeringEngineeringPower DeviceConverter Behavior +8

Degradation mechanisms of GaN-based LEDs after accelerated DC current aging

Gaudenzio Meneghesso, S. Levada, R. Pierobon, +7

Electrical EngineeringSolid-state LightingEngineeringNanoelectronicsApplied Physics +10

Influence of gate-leakage current on drain current collapse of unpassivated GaN∕AlGaN∕GaN high electron mobility transistors

P. Kordoš, J. Bernát, M. Marso, +5

Applied Physics Letters

Device ModelingWide-bandgap SemiconductorElectrical EngineeringSemiconductor TechnologyEngineering +9

Two-dimensional micro-Raman mapping of stress and strain distributions in strained silicon waveguides

Federica Bianco, Kamil Fedus, Francesco Enrichi, +5

Semiconductor Science and Technology

Optical MaterialsEngineeringStrained WaveguidesOptical CharacterizationSilicon On Insulator +15

Investigation of luminescent dye-doped or rare-earth-doped monodisperse silica nanospheres for DNA microarray labelling

Francesco Enrichi, Raffaele Riccò, Anna Meneghello, +7

Optical Materials

Dna NanotechnologyEngineeringBiomedical DiagnosticsNanomaterialsColloidal Nanocrystals +4

Experimental/numerical investigation on current collapse in AlGaN/GaN HEMT's

G. Verzellesi, R. Pierobon, Fabiana Rampazzo, +5

Wide-bandgap SemiconductorElectrical EngineeringUngated Device SurfaceEngineeringRf Semiconductor +12

Hot-electron-stress degradation in unpassivated GaN/AlGaN/GaN HEMTs on SiC

Gaudenzio Meneghesso, R. Pierobon, Fabiana Rampazzo, +7

Materials EngineeringWide-bandgap SemiconductorElectrical EngineeringEngineeringApplied Physics +6