S. Levada

Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress

M. Pavesi, M. Manfredi, G. Salviati et al. · Applied Physics Letters · 2004 · 62 citations

High Current Levels, Optical Materials, Engineering +22

Failure Modes and Mechanisms of DC-Aged GaN LEDs

Gaudenzio Meneghesso, S. Levada, Enrico Zanoni et al. · physica status solidi (a) · 2002 · 57 citations

Electrical Engineering, Solid-state Lighting, High-brightness Gan/ingan Leds +12

Reliability of visible GaN LEDs in plastic package

Gaudenzio Meneghesso, S. Levada, Enrico Zanoni et al. · Microelectronics Reliability · 2003 · 51 citations

Electrical Engineering, Solid-state Lighting, Visible Gan Leds +4

Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model

S. Levada, Matteo Meneghini, Gaudenzio Meneghesso et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 45 citations

Engineering, Gallium-nitride-based Light-emitting Diode, Gan Leds +18

Degradation mechanisms of GaN-based LEDs after accelerated DC current aging

Gaudenzio Meneghesso, S. Levada, R. Pierobon et al. · 2003 · 40 citations

Electrical Engineering, Solid-state Lighting, Engineering +12