M. Pavesi

Accelerated Life Test of High Brightness Light Emitting Diodes

Lorenzo Roberto Trevisanello, Matteo Meneghini, G. Mura et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 161 citations

Engineering, Electrical Engineering, Materials Science +17

ε-Ga2O3 epilayers as a material for solar-blind UV photodetectors

M. Pavesi, Filippo Fabbri, Francesco Boschi et al. · Materials Chemistry and Physics · 2017 · 135 citations

Natural Sciences, Materials Engineering, Materials Science +14

Thermal stability of ε-Ga2O3 polymorph

R. Fornari, M. Pavesi, V. Montedoro et al. · Acta Materialia · 2017 · 134 citations

Natural Sciences, Materials Engineering, Materials Science +12

Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes

Francesca Rossi, M. Pavesi, Matteo Meneghini et al. · Journal of Applied Physics · 2006 · 87 citations

Engineering, Electrical Engineering, Materials Science +17

Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress

M. Pavesi, M. Manfredi, G. Salviati et al. · Applied Physics Letters · 2004 · 62 citations

Engineering, Materials Engineering, Materials Science +17