Jungwoo Joh

GaN HEMT reliability

Jesús A. del Alamo, Jungwoo Joh · Microelectronics Reliability · 2009 · 483 citations

A Current-Transient Methodology for Trap Analysis for GaN High Electron Mobility Transistors

Jungwoo Joh, Jesús A. del Alamo · IEEE Transactions on Electron Devices · 2010 · 416 citations

Engineering, Electrical Engineering, Materials Science +17

Critical Voltage for Electrical Degradation of GaN High-Electron Mobility Transistors

Jungwoo Joh, Jesús A. del Alamo · IEEE Electron Device Letters · 2008 · 299 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors

Jungwoo Joh, Jesús A. del Alamo · 2006 · 194 citations

Engineering, Electrical Engineering, Materials Science +17

Measurement of Channel Temperature in GaN High-Electron Mobility Transistors

Jungwoo Joh, Jesús A. del Alamo, Uttiya Chowdhury et al. · IEEE Transactions on Electron Devices · 2009 · 179 citations · Full text

Engineering, Electrical Engineering, Materials Science +17