M. Peroni

Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing

Enrico Zanoni, Francesca Danesin, Matteo Meneghini et al. · IEEE Electron Device Letters · 2009 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

A C-band high-efficiency second-harmonic-tuned hybrid power amplifier in GaN technology

Paolo Colantonio, F. Giannini, Rocco Giofrè et al. · IEEE Transactions on Microwave Theory and Techniques · 2006 · 82 citations

Engineering, Electrical Engineering, Materials Science +17

X-band GaN-HEMT LNA performance versus robustness trade-off

A. Bettidi, F. Corsaro, A. Cetronio et al. · 2009 · 48 citations

Engineering, Electrical Engineering, Microelectronics +16

Application of electromagnetic stirring for the homogenization of aluminium billet cast in a semi-continuous machine

Carlo Mapelli, Andrea Gruttadauria, M. Peroni · Journal of Materials Processing Technology · 2009 · 46 citations

Engineering, Manufacturing Engineering, Materials Engineering +13

A global approach to the management of EMR (Electronic Medical Records) of patients with HIV/AIDS in Sub-Saharan Africa: the experience of DREAM Software

Andrea Nucita, Giuseppe Massimo Bernava, Michelangelo Bartolo et al. · BMC Medical Informatics and Decision Making · 2009 · 43 citations · Full text

Computing, Health Informatics, Health Systems +17