Microelectronics Journal · 2001 · 92 citations · 7 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMicrofabricationSemiconductor DevicesEtching ProcessesHigh-temperature PlasmasMems FabricationMicrostructure ControlSemiconductor Device MaterialsSilicon MaterialsErosion RatesEtch RateEtch SelectivityPlasma EtchingProfile ControlSelectivitySiliconSilicon Etching
7
Henri Jansen, M. de Boer, R. Legtenberg · Journal of Micromechanics and Microengineering · 1995 · 593 citations · Full text
Keizô Suzuki, Sadayuki Okudaira, N. Sakudo et al. · Japanese Journal of Applied Physics · 1977 · 236 citations
BSM 7: RIE lag in high aspect ratio trench etching of silicon
Henri Jansen, M. de Boer, Remco J. Wiegerink et al. · Microelectronic Engineering · 1997 · 144 citations · Full text