Journal of Vacuum Science and Technology

Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatings

John A. Thornton · 1974 · 2.3K citations

Natural Sciences, Materials Engineering, Materials Science +17

New and unified model for Schottky barrier and III–V insulator interface states formation

W. E. Spicer, P. W. Chye, Perry Skeath et al. · 1979 · 930 citations

Engineering, Materials Engineering, Materials Science +17

Auger and photoelectron line energy relationships in aluminum–oxygen and silicon–oxygen compounds

C. D. Wagner, D. E. Passoja, H. F. Hillery et al. · 1982 · 832 citations

Natural Sciences, Chemistry, Materials Science +15

Defects associated with the accommodation of misfit between crystals

J. W. Matthews · 1975 · 697 citations

Natural Sciences, Materials Engineering, Materials Science +17

Unified defect model and beyond

W. E. Spicer, I. Lindau, Perry Skeath et al. · 1980 · 646 citations

Natural Sciences, Materials Science, Physics +17