2013 · 10 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationOxide SemiconductorsSemiconductor Device MaterialsSemiconductor ReliabilityWide Band Gap SemiconductorsGate Oxide InterfacesGate Oxide LeakageOxidationSilicon Carbide (Sic) MaterialsThreshold VoltageThreshold Voltage ScalingThreshold Voltage StabilityWet Oxidation
The threshold voltage of 4H-SiC MOSFET increases drastically by performing wet oxidation after nitridation of gate oxide without significant decrease in the channel effective mobility. The increment of the threshold voltage depends on the wet oxidation conditions, and wet oxidation improves the trade-off between the threshold voltage and the specific on-resistance. We fabricated 600 V 4H-SiC MOSFETs with a threshold voltage of 5.11 V and a specific on-resistance of 5.2 mΩcm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> using the procedure above. The stability of the threshold voltage for the SiC-MOSFETs was confirmed by a HTGB test.
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Characteristics of 4H–SiC MOS interface annealed in N2O
Keiko Fujihira, Yoichiro Tarui, Masayuki Imaizumi et al. · Solid-State Electronics · 2005 · 78 citations