Effects of various Co/TiN and Co/Ti layer stacks and the salicide rapid thermal process conditions on cobalt silicide formation

S. Buschbaum, O. Fursenko, D. Bolze, D. Wolansky, V. Melnik, J. Nieß, W. Lerch

Microelectronic Engineering · 2004 · 16 citations · 5 references

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