Microelectronics Reliability · 2011 · 15 citations · 13 references
Wide-bandgap SemiconductorElectrical EngineeringEngineeringApplied PhysicsThermal Stability InvestigationsAluminum Gallium NitrideGan Power DeviceAlgan/gan Hemts
13
R. Simms, James W. Pomeroy, Michael J. Uren et al. · IEEE Transactions on Electron Devices · 2008 · 124 citations
Wide-bandgap Semiconductor, Peak Channel Temperatures, Electrical Engineering +15
Copper gate AlGaN/GaN HEMT with low gate leakage current
Jin‐Ping Ao, Daigo Kikuta, Naotaka Kubota et al. · IEEE Electron Device Letters · 2003 · 74 citations
Materials Science, Semiconductors, Electrical Engineering +11