The effects of mechanical planar biaxial strain in Si/SiGe HBT BiCMOS technology

B.M. Haugerud, Mustayeen B. Nayeem, Ramkumar Krithivasan, Yuan Lu, Chendong Zhu, John D. Cressler, R. E. Belford, Alvin Joseph

Solid-State Electronics · 2005 · 10 citations · 13 references

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