Solid-State Electronics · 2005 · 10 citations · 13 references
EngineeringBias Temperature InstabilityMechanical EngineeringApplied PhysicsSolid MechanicsSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsMechanics Of MaterialsHigh Strain Rate
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A 90-nm logic technology featuring strained-silicon
Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Transactions on Electron Devices · 2004 · 654 citations
Chiral Quest receives US patent for DIOP* ligand family
Focus on Catalysts · 2003 · 246 citations
C. W. Leitz, M. T. Currie, Minjoo Larry Lee et al. · Journal of Applied Physics · 2002 · 169 citations
Characteristics and device design of sub-100 nm strained Si N- and PMOSFETs
K. Rim, J. O. Chu, H. Chen et al. · 2003 · 143 citations
Electrical Engineering, Engineering, Strained Si Devices +11