Chendong Zhu

CMOS reliability issues for emerging cryogenic Lunar electronics applications

Tianbing Chen, Chendong Zhu, Laleh Najafizadeh et al. · Solid-State Electronics · 2006 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +14

Monitoring and Identification of Road Construction Safety Factors via UAV

Chendong Zhu, Junqing Zhu, Tianxiang Bu et al. · Sensors · 2022 · 41 citations · Full text

Engineering, Civil Engineering, Construction Management +15

A High-Slew Rate SiGe BiCMOS Operational Amplifier for Operation Down to Deep Cryogenic Temperatures

Ramkumar Krithivasan, Yuan Lu, Laleh Najafizadeh et al. · Proceedings of the ... Bipolar/BiCMOS Circuits and Technology Meeting/Proceedings of the ... BipolarBiCMOS Circuits and Technology Meeting · 2006 · 30 citations

Engineering, Electrical Engineering, Electronic Materials +16

Damage mechanisms in impact-ionization-induced mixed-mode reliability degradation of SiGe HBTs

Chendong Zhu, Qingqing Liang, R.A. Al-Huq et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 29 citations

Engineering, Electrical Engineering, Microelectronics +16

Understanding Radiation- and Hot Carrier-Induced Damage Processes in SiGe HBTs Using Mixed-Mode Electrical Stress

Peng Cheng, Bongim Jun, Akil K. Sutton et al. · IEEE Transactions on Nuclear Science · 2007 · 21 citations

Engineering, Electrical Engineering, Materials Science +17