Chendong Zhu

CMOS reliability issues for emerging cryogenic Lunar electronics applications

Tianbing Chen, Chendong Zhu, Laleh Najafizadeh et al. · Solid-State Electronics · 2006 · 41 citations

Reliability, Electrical Engineering, Engineering +6

A High-Slew Rate SiGe BiCMOS Operational Amplifier for Operation Down to Deep Cryogenic Temperatures

Ramkumar Krithivasan, Yuan Lu, Laleh Najafizadeh et al. · Proceedings of the ... Bipolar/BiCMOS Circuits and Technology Meeting/Proceedings of the ... BipolarBiCMOS Circuits and Technology Meeting · 2006 · 29 citations

Electrical Engineering, Engineering, Rf Semiconductor +14

Damage mechanisms in impact-ionization-induced mixed-mode reliability degradation of SiGe HBTs

Chendong Zhu, Qingqing Liang, R.A. Al-Huq et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 29 citations

Electrical Engineering, Mixed-mode Stress, Engineering +13

Understanding Radiation- and Hot Carrier-Induced Damage Processes in SiGe HBTs Using Mixed-Mode Electrical Stress

Peng Cheng, Bongim Jun, Akil K. Sutton et al. · IEEE Transactions on Nuclear Science · 2007 · 21 citations

Engineering, Mixed-mode Annealing, Trap Generation +16

SiGe BiCMOS Precision Voltage References for Extreme Temperature Range Electronics

Laleh Najafizadeh, Chendong Zhu, Ramkumar Krithivasan et al. · 2006 · 21 citations

Unique Ge Profiles, Engineering, Vlsi Design +16