Concepedia

R.A. Al-Huq

RA

Statistics

Publications

2

Citations

47

H-Index

2

Active since

2004

Affiliations

IBM (United States)(Current)

Auburn University

Georgia Institute of Technology

R.A. Al-Huq is an author at IBM (United States) specializing in electromagnetic compatibility, electrical engineering, and microelectronics.

Top concepts

EngineeringApplied PhysicsMicroelectronicsElectronic PackagingElectrical EngineeringElectromagnetic CompatibilityComputer EngineeringMechanics Of MaterialsReliability Engineering

Publications per year

2004–2005

2

Publications

2

Damage mechanisms in impact-ionization-induced mixed-mode reliability degradation of SiGe HBTs

Chendong Zhu, Qingqing Liang, R.A. Al-Huq et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 29 citations

Electrical Engineering, Mixed-mode Stress, Engineering +13

An investigation of the damage mechanisms in impact ionization-induced "mixed-mode" reliability stressing of scaled SiGe HBTs

Chendong Zhu, Qingqing Liang, R.A. Al-Huq et al. · 2004 · 18 citations

Engineering, Scaled Sige Hbts, Reliability Stressing +19

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