Scott E. Thompson

Moore's law: the future of Si microelectronics

Scott E. Thompson, Srivatsan Parthasarathy · Materials Today · 2006 · 660 citations · Full text

Miniaturization, Engineering, Vacuum Device +18

A 90-nm logic technology featuring strained-silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Transactions on Electron Devices · 2004 · 654 citations

Electrical Engineering, Engineering, Nanoelectronics +10

Uniaxial-process-induced strained-Si: extending the CMOS roadmap

Scott E. Thompson, Guangyu Sun, Youn Sung Choi et al. · IEEE Transactions on Electron Devices · 2006 · 578 citations

Electrical Engineering, Engineering, Nanoelectronics +12

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

T. Ghani, M Armstrong, C. Auth et al. · 2004 · 559 citations

Silicon Cmos Transistors, Engineering, High Volume +17

A Logic Nanotechnology Featuring Strained-Silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Electron Device Letters · 2004 · 511 citations

Electrical Engineering, Engineering, Flexible Electronics +12