Scott E. Thompson

Moore's law: the future of Si microelectronics

Scott E. Thompson, Srivatsan Parthasarathy · Materials Today · 2006 · 669 citations · Full text

Engineering, Electrical Engineering, Materials Science +15

A 90-nm logic technology featuring strained-silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Transactions on Electron Devices · 2004 · 666 citations

Engineering, Electrical Engineering, Materials Science +17

Uniaxial-process-induced strained-Si: extending the CMOS roadmap

Scott E. Thompson, Guangyu Sun, Youn Sung Choi et al. · IEEE Transactions on Electron Devices · 2006 · 585 citations

Engineering, Electrical Engineering, Materials Science +17

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

T. Ghani, M Armstrong, C. Auth et al. · 2004 · 561 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Logic Nanotechnology Featuring Strained-Silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Electron Device Letters · 2004 · 513 citations

Engineering, Electrical Engineering, Materials Science +17