Package Warpage Control

Package Warpage Control is a methodological framework within MEMS packaging that specifically addresses the mitigation and management of thermomechanical deformation during fabrication and operation by regulating material anisotropy, residual stress, and coefficient of thermal expansion mismatches to ensure structural integrity and dimensional stability.

47

Publications

1.3K

Citations

242

Authors

57

Institutions

Publications per year

2017–2026

20

Authors

242

  1. XF
    Xuejun Fan

    Lamar University, United States

    3 publications · 119 citations

    3

    h-index

  2. XC
    Xi Cao

    ASM Pacific Technology (China), China

    2 publications · 59 citations

    2

    h-index

  3. RS
    Richard Strode

    Micron (United States), United States

    2 publications · 28 citations

    2

    h-index

  4. RA
    Ravikumar Adimula

    Micron (United States), United States

    2 publications · 28 citations

    2

    h-index

  5. NV
    Niranjan Vijayaragavan

    STATS ChipPAC (Singapore), Singapore

    2 publications · 55 citations

    2

    h-index

1–5 of 242

Venues

  1. 8

    h-index

  2. Microelectronics Reliability

    5 publications · 195 citations

    5

    h-index

  3. IMAPSource Proceedings

    1 publications · 11 citations

    1

    h-index

  4. 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC)

    Conference · 1 publications · 21 citations

    1

    h-index

  5. Microelectronic Engineering

    1 publications · 12 citations

    1

    h-index

1–5