Concepedia

Author

Hideki Satake

Toshiba (Japan)

Also Known As

H. Satake, Hideki SATAKE, Hideki Satake

129

Publications

1.6K

Citations

21

H-Index

52

Concepts

All Affiliations

Toshiba (Japan)The University of TokyoTokyo University of ScienceAssociation of Super-Advanced ElectronicsNational Institute of Advanced Industrial Science and Technology
HS

About

Hideki Satake is an author at Toshiba (Japan) specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

21

38

1.3K

2

Applied Physics

20

33

1.2K

3

Chemical Engineering

3

3

43

4

Chemistry

2

2

38

5

Natural Sciences

1

1

12

Hideki Satake

×

41

Publications

1.3K

Citations

21

H-Index

YearCitations

Electron and hole mobility enhancement in strained-Si MOSFET's on SiGe-on-insulator substrates fabricated by SIMOX technology

Tomohisa Mizuno, Shinichi Takagi, Naoharu Sugiyama,

IEEE Electron Device Letters

2000

202

NBTI mechanism in ultra-thin gate dielectric - nitrogen-originated mechanism in SiON

Yuichiro Mitani, M. Nagamine, Hideki Satake,

2003

88

Interfacial properties of single-crystalline CeO2 high-<i>k</i> gate dielectrics directly grown on Si (111)

Yukie Nishikawa, Takeshi Yamaguchi, Masahiko Yoshiki,

Applied Physics Letters

2002

74

Influence of Nitrogen on Negative Bias Temperature Instability in Ultrathin SiON

Yuichiro Mitani, Hideki Satake, Akira Toriumi

IEEE Transactions on Device and Materials Reliability

2008

71

Applicability limits of the two-frequency capacitance measurement technique for the thickness extraction of ultrathin gate oxide

Akiko Nara, Naoki Yasuda, Hideki Satake,

IEEE Transactions on Semiconductor Manufacturing

2002

60

Correlation between two dielectric breakdown mechanisms in ultra-thin gate oxides

Hideki Satake, Naoki Yasuda, Shinichi Takagi,

Applied Physics Letters

1996

51

Improvement of charge-to-breakdown distribution by fluorine incorporation into thin gate oxides

Yuichiro Mitani, Hideki Satake, Yasushi Nakasaki,

IEEE Transactions on Electron Devices

2003

48

Physical random number generator based on MOS structure after soft breakdown

S. Yasuda, Hideki Satake, Tetsufumi Tanamoto,

IEEE Journal of Solid-State Circuits

2004

46

Observation of anisotropic microstructural changes during cycling in LiNi0.5Co0.2Mn0.3O2 cathode material

Hiromichi Kuriyama, Hidesato Saruwatari, Hideki Satake,

Journal of Power Sources

2014

44

Dielectric breakdown mechanism of thin-SiO/sub 2/ studied by the post-breakdown resistance statistics

Hideki Satake, Akira Toriumi

IEEE Transactions on Electron Devices

2000

39

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