Concepedia

S. Bruyère

SB

Statistics

Publications

25

Citations

1.2K

H-Index

16

Active since

1997

Affiliations

STMicroelectronics (France)(Current)

Centre National de la Recherche Scientifique

Philips (France)

STMicroelectronics (Switzerland)

Université Joseph Fourier

S. Bruyère is an author at STMicroelectronics (France) specializing in microelectronics, materials science, and electronic materials.

Publications per year

1997–2010

25

Publications

25

Review on high-k dielectrics reliability issues

G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 523 citations

Engineering, Electrical Engineering, Materials Science +17

A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment

F. Monsieur, Emmanuel Vincent, D. Roy et al. · 2003 · 118 citations

Engineering, Electrical Engineering, Materials Science +17

Evidence for hydrogen-related defects during NBTl stress in p-MOSFETs

V. Huard, F. Monsieur, G. Ribes et al. · 2003 · 75 citations

Engineering, Electrical Engineering, Materials Science +17

MIM capacitance variation under electrical stress

C. Besset, S. Bruyère, S. Blonkowski et al. · Microelectronics Reliability · 2003 · 49 citations

Natural Sciences, Electrical Engineering, Materials Science +14

Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics

G. Ghibaudo, S. Bruyère, T. Devoivre et al. · IEEE Transactions on Semiconductor Manufacturing · 2000 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

1–5 of 25