D. Roy

Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

A. Bravaix, C. Guérin, V. Huard et al. · 2009 · 178 citations

Low-power Electronics, Electrical Engineering, Engineering +13

A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment

F. Monsieur, Emmanuel Vincent, D. Roy et al. · 2003 · 118 citations

Engineering, Industrial Reliability Assessment, Reliability Criterion +19

Microscopic scale characterization and modeling of transistor degradation under HC stress

Yoann Mamy Randriamihaja, V. Huard, X. Federspiel et al. · Microelectronics Reliability · 2012 · 47 citations · Full text

Electrical Engineering, Hc Stress, Engineering +10

$1.62\mu \mathrm{m}$ Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared

Jonathan S. Steckel, E. Josse, Andras G. Pattantyus‐Abraham et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 47 citations

Optical Materials, Quantum Photonics, Shortwave Infrared +30

28nm node bulk vs FDSOI reliability comparison

X. Federspiel, D. Angot, M. Rafik et al. · 2012 · 34 citations

Reliability, Electrical Engineering, Reliability Engineering +14