M. Rafik

28nm FDSOI technology platform for high-speed low-voltage digital applications

N. Planes, O. Weber, V. Barral et al. · 2012 · 422 citations

Engineering, Vlsi Design, Emerging Memory Technology +16

14nm FDSOI technology for high speed and energy efficient applications

O. Weber, E. Josse, F. Andrieu et al. · 2014 · 89 citations

Low-power Electronics, Electrical Engineering, Engineering +9

28nm node bulk vs FDSOI reliability comparison

X. Federspiel, D. Angot, M. Rafik et al. · 2012 · 34 citations

Reliability, Electrical Engineering, Reliability Engineering +14

AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment

M. Rafik, A.-P. Nguyen, X. Garros et al. · 2018 · 31 citations

Reliability, Electrical Engineering, Reliability Engineering +15

Interaction between BTI and HCI degradation in High-K devices

X. Federspiel, M. Rafik, D. Angot et al. · 2013 · 30 citations

Defect Tolerance, Electrical Engineering, Engineering +11