D. Angot

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

D. Angot, V. Huard, Lama Rahhal et al. · 2013 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

28nm node bulk vs FDSOI reliability comparison

X. Federspiel, D. Angot, M. Rafik et al. · 2012 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +12

Interaction between BTI and HCI degradation in High-K devices

X. Federspiel, M. Rafik, D. Angot et al. · 2013 · 30 citations

Engineering, Electrical Engineering, Materials Science +15

Impact of the gate-stack change from 40nm node SiON to 28nm High-K Metal Gate on the Hot-Carrier and Bias Temperature damage

A. Bravaix, Yoann Mamy Randriamihaja, V. Huard et al. · 2013 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Technology scaling and reliability: Challenges and opportunities

V. Huard, F. Cacho, X. Federspiel et al. · 2015 · 26 citations

Engineering, Computer Engineering, Computer Systems +13