F. Cacho

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

D. Angot, V. Huard, Lama Rahhal et al. · 2013 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses

Laurent Negre, David Roy, F. Cacho et al. · IEEE Journal of Solid-State Circuits · 2012 · 40 citations

Engineering, Electrical Engineering, Aging +16

Managing SRAM reliability from bitcell to library level

Vincent Huard, Remy Chevallier, C. Parthasarathy et al. · 2010 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +17

28nm node bulk vs FDSOI reliability comparison

X. Federspiel, D. Angot, M. Rafik et al. · 2012 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +12

Energy-driven Hot-Carrier model in advanced nodes

W. Arfaoui, X. Federspiel, P. Mora et al. · 2014 · 32 citations

Engineering, Electrical Engineering, Microelectronics +16