6
Publications
75
Citations
6
H-Index
2004
Active since
F. Lallement is an author at STMicroelectronics (France) specializing in applied physics, engineering, and microelectronics.
Top concepts
EngineeringApplied PhysicsMicroelectronicsElectrical EngineeringNanoelectronicsPhysicsElectronic PackagingMaterials EngineeringThin FilmsPlasma Physics
Publications per year
2004–2009
6
6
USJ formation using pulsed plasma doping
J.T. Scheuer, D. Lenoble, J.-P. Reynard et al. · Surface and Coatings Technology · 2004 · 13 citations
Plasma doping implant depth profile calculation based on ion energy distribution measurements
Ludovic Godet, Ziwei Fang, Svetlana Radovanov et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2006 · 11 citations · Full text
Highly-Strained Silicon-On-Insulator Development
T. Akatsu, Jean‐Michel Hartmann, C. Aulnette et al. · ECS Transactions · 2006 · 11 citations
Materials Engineering, Semiconductor Technology, Electrical Engineering +14
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