R. Nachman

Effect of pMOST bias-temperature instability on circuit reliability performance

Yung-Huei Lee, Neal Mielke, Babak Sabi et al. · 2004 · 35 citations

Engineering, Electrical Engineering, Materials Engineering +16

Thermal effects in x-ray masks during synchrotron storage ring irradiation

Yuli Vladimirsky, José R. Maldonado, R. Fair et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1989 · 24 citations

Engineering, Materials Engineering, Materials Science +15

Implant damage and gate-oxide-edge effects on product reliability

Yung-Huei Lee, R. Nachman, Shiliang Hu et al. · 2005 · 14 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +14

The impact of PMOST bias-temperature degradation on logic circuit reliability performance

Yung-Huei Lee, Steve Jacobs, Stefan Stadler et al. · Microelectronics Reliability · 2004 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +14

Modeling image formation: Application to mask optimization

Jiabei Xiao, Mumit Khan, R. Nachman et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1994 · 14 citations

Engineering, Manufacturing Engineering, Materials Engineering +13