Yung-Huei Lee

Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown

Yung-Huei Lee, Neal Mielke, M. Agostinelli et al. · 2006 · 60 citations

Reliability, Electrical Engineering, Reliability Engineering +15

Effect of pMOST bias-temperature instability on circuit reliability performance

Yung-Huei Lee, Neal Mielke, Babak Sabi et al. · 2004 · 35 citations

Engineering, Pmost Bias-temperature Instability, Logic Product Speed +16

Shallow Trench Isolation Edge Effect on Random Telegraph Signal Noise and Implications for Flash Memory

Ruey-Ven Wang, Yung-Huei Lee, Yin-Lung Ryan Lu et al. · IEEE Transactions on Electron Devices · 2009 · 30 citations

Electrical Engineering, Width Scaling, Engineering +11

RTS Noise Characterization in Flash Cells

Sing-Rong Li, William McMahon, Yin-Lung Ryan Lu et al. · IEEE Electron Device Letters · 2008 · 28 citations

Electrical Engineering, Engineering, Nanoelectronics +12

Reliability study of perpendicular STT-MRAM as emerging embedded memory qualified for reflow soldering at 260°C

Meng-Chun Shih, Chia-Yu Wang, Yung-Huei Lee et al. · 2016 · 22 citations

Reflow Soldering, Non-volatile Memory, Reliability Study +22