Concepedia

Yin-Lung Ryan Lu

YR

3

Publications

68

Citations

3

H-Index

2007

Active since

Affiliations

Intel (United States)(Current)

Yin-Lung Ryan Lu is an author at Intel (United States) specializing in engineering, microelectronics, and electrical engineering.

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Publications per year

2007–2009

3

Publications

3

Shallow Trench Isolation Edge Effect on Random Telegraph Signal Noise and Implications for Flash Memory

Ruey-Ven Wang, Yung-Huei Lee, Yin-Lung Ryan Lu et al. · IEEE Transactions on Electron Devices · 2009 · 30 citations

, , +11

RTS Noise Characterization in Flash Cells

Sing-Rong Li, William McMahon, Yin-Lung Ryan Lu et al. · IEEE Electron Device Letters · 2008 · 28 citations

, , +12

Thin-Gate-Oxide Breakdown and CPU Failure-Rate Estimation

Yung-Huei Lee, Neal Mielke, William McMahon et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 10 citations

, , +15

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