William McMahon

Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown

Yung-Huei Lee, Neal Mielke, M. Agostinelli et al. · 2006 · 60 citations

Reliability, Electrical Engineering, Reliability Engineering +15

Shallow Trench Isolation Edge Effect on Random Telegraph Signal Noise and Implications for Flash Memory

Ruey-Ven Wang, Yung-Huei Lee, Yin-Lung Ryan Lu et al. · IEEE Transactions on Electron Devices · 2009 · 30 citations

Electrical Engineering, Width Scaling, Engineering +11

RTS Noise Characterization in Flash Cells

Sing-Rong Li, William McMahon, Yin-Lung Ryan Lu et al. · IEEE Electron Device Letters · 2008 · 28 citations

Electrical Engineering, Engineering, Nanoelectronics +12

Nano-oxide-layer insertion and specular effects in spin valves: Experiment and theory

L. Wang, Jinkai Qiu, William McMahon et al. · Physical Review B · 2004 · 24 citations

Engineering, Magnetic Resonance, Spintronic Material +20

Photoelectric Yields for Oblique Incidence of Extreme Ultraviolet Radiation*

L. Heroux, James E. Manson, H. E. Hinteregger et al. · Journal of the Optical Society of America · 1965 · 17 citations

Ultraviolet Light, Photoelectric Sensor, Optical Materials +11