Statistics
Publications
1
Citations
60
H-Index
1
Active since
2006
Affiliations
Intel (United States)(Current)
Sukirti Gupta is an author at Intel (United States) specializing in accelerated life testing, lifetime estimation, and gate oxide degradation.
Publications per year
2006–2006
1
1
Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown
Yung-Huei Lee, Neal Mielke, Sukirti Gupta et al. · 2006 · 60 citations
Engineering, Computer Engineering, Electrical Engineering +17
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