Concepedia

Babak Sabi

BS

4

Publications

98

Citations

4

H-Index

1987

Active since

Affiliations

Intel (United States)(Current)

Babak Sabi is an author at Intel (United States) specializing in engineering, electrical engineering, and microelectronics.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringElectronic PackagingReliabilityApplied PhysicsReliability EngineeringBusinessCorrosionStability

Publications per year

1987–2004

4

Publications

4

Effect of pMOST bias-temperature instability on circuit reliability performance

Yung-Huei Lee, Neal Mielke, Babak Sabi et al. · 2004 · 35 citations

Engineering, Pmost Bias-temperature Instability, Logic Product Speed +16

Statistics for Electromigration Testing

Harry A. Schafft, James A. Lechner, Babak Sabi et al. · Reliability physics · 1988 · 27 citations

Engineering, Industrial Engineering, Mechanical Engineering +20

Unified characterization of two-region gate bias stress in submicrometer p-channel MOSFETs

Yuan Tang, D.M. Kim, Y.-H. Lee et al. · IEEE Electron Device Letters · 1990 · 20 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13

Electromigration Testing of Ti/Al-Si Metallization for Integrated Circuits

J. Maiz, Babak Sabi · 1987 · 16 citations

Engineering, Electromigration Tests, Integrated Circuits +17

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