The impact of PMOST bias-temperature degradation on logic circuit reliability performance

Mechanism of negative-bias-temperature instability

C. E. Blat, E. H. Nicollian, Edward H. Poindexter · Journal of Applied Physics · 1991 · 242 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Engineering, Computer Engineering, Electrical Engineering +14

Interface-trap generation at ultrathin SiO2 (4–6 nm)-Si interfaces during negative-bias temperature aging

Shigeo Ogawa, Masakazu Shimaya, Noboru Shiono · Journal of Applied Physics · 1995 · 198 citations

Engineering, Materials Engineering, Materials Science +17

Bias temperature instability in scaled p/sup +/ polysilicon gate p-MOSFET's

T. Yamamoto, K. Uwasawa, Tohru Mogami · IEEE Transactions on Electron Devices · 1999 · 158 citations

Engineering, Electrical Engineering, Microelectronics +16

The statistics of NBTI-induced V/sub T/ and β mismatch shifts in pMOSFETs

Stewart E. Rauch · IEEE Transactions on Device and Materials Reliability · 2002 · 88 citations

Engineering, Electrical Engineering, Analog Electronics +16