Yuli Vladimirsky

Nanometer focusing of hard x rays by phase zone plates

W. Yun, Barry Lai, Zhonghou Cai et al. · Review of Scientific Instruments · 1999 · 222 citations

Natural Sciences, Materials Science, Biomedical Optics +12

Scanning x-ray microscope with 75-nm resolution

H. Rarback, Deming Shu, Su Cheng Feng et al. · Review of Scientific Instruments · 1988 · 108 citations

Natural Sciences, Biomedical Engineering, Biomedical Imaging +14

Demagnification in proximity x-ray lithography and extensibility to 25 nm by optimizing Fresnel diffraction

Yuli Vladimirsky, A. J. Bourdillon, Olga Vladimirsky et al. · Journal of Physics D Applied Physics · 1999 · 55 citations

Engineering, Manufacturing Engineering, Materials Science +12

Nanostructure technology

T. H. P. Chang, D. P. Kern, E. Kratschmer et al. · IBM Journal of Research and Development · 1988 · 50 citations

Engineering, Materials Engineering, Materials Science +13

A critical condition in Fresnel diffraction used for ultra-high resolution lithographic printing

A. J. Bourdillon, Chris Boothroyd, J R Kong et al. · Journal of Physics D Applied Physics · 2000 · 33 citations

Engineering, Manufacturing Engineering, Materials Engineering +12