Nanostructure technology

T. H. P. Chang, D. P. Kern, E. Kratschmer, K. Y. Lee, H.E. Luhn, M. A. McCord, S. A. Rishton, Yuli Vladimirsky

IBM Journal of Research and Development · 1988 · 50 citations · 105 references

Concepts

Abstract

The ability to fabricate structures with lateral dimensions in the sub-100-nm range has opened a new field of research. This paper first reviews recent advances in nanolithography techniques, with a brief discussion of their relative merits and fundamental limits. Special emphasis is given to the scanning electron-beam method, which is the most widely used nanolithography method at the present time. The two main areas of nanostructure research are device technology and basic science. Highlights of a number of exploratory programs in these two areas are presented.

References

105