All Affiliations
| # | Concept | H-Index | Publications | Citations |
|---|---|---|---|---|
1 | Engineering | 15 | 19 | 759 |
2 | Electrical Engineering | 14 | 16 | 615 |
3 | Applied Physics | 13 | 15 | 534 |
4 | Computer Engineering | 3 | 3 | 89 |
5 | Materials Engineering | 3 | 3 | 120 |
H. Ceric
×
22
Publications
808
Citations
16
H-Index
| Year | Citations | |
|---|---|---|
2010 | 145 | |
2010 | 90 | |
2009 | 63 | |
2010 | 57 | |
2012 | 57 | |
A Comprehensive TCAD Approach for Assessing Electromigration Reliability of Modern Interconnects H. Ceric, Roberto Lacerda de Orio, J. Cervenka, IEEE Transactions on Device and Materials Reliability EngineeringMechanical EngineeringAssessing Electromigration ReliabilityInterconnect (Integrated Circuits)Reliability Engineering | 2008 | 54 |
2015 | 39 | |
2011 | 34 | |
2011 | 31 | |
2011 | 29 |
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