Concepedia

S. Carniello

SC

Statistics

Publications

8

Citations

233

H-Index

8

Active since

2009

Affiliations

AMS (Austria)(Current)

Universität der Bundeswehr München

University of Vienna

Christian Doppler Laboratory for Thermoelectricity

S. Carniello is an author at AMS (Austria) specializing in semiconductor devices, device reliability, and materials science.

Publications per year

2009–2019

8

Publications

8

Interface traps density-of-states as a vital component for hot-carrier degradation modeling

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl et al. · Microelectronics Reliability · 2010 · 58 citations

Engineering, Electrical Engineering, Materials Science +14

Through Silicon Via Reliability

Cathal Cassidy, Jochen Kraft, S. Carniello et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 57 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

Hot-carrier degradation caused interface state profile—Simulation versus experiment

Ivan A. Starkov, Stanislav Tyaginov, H. Enichlmair et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 33 citations

Engineering, Electrical Engineering, Materials Science +17

Hot-carrier degradation modeling using full-band Monte-Carlo simulations

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl et al. · 2010 · 26 citations

Engineering, Electrical Engineering, Electronic Materials +16

Stress measurements in tungsten coated through silicon vias for 3D integration

C. Krauss, S. Labat, S. Escoubas et al. · Thin Solid Films · 2012 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +10

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