Interface traps density-of-states as a vital component for hot-carrier degradation modeling

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl, +11

Microelectronics Reliability

Device ModelingEngineeringPhysicsBias Temperature InstabilityCondensed Matter Physics +8

Physics-Based Hot-Carrier Degradation Modeling

Stanislav Tyaginov, Ivan A. Starkov, H. Enichlmair, +3

ECS Transactions

EngineeringThorough AnalysisNanoelectronicsTransport PhenomenaThermodynamics +14

Observations of negative bias temperature instability defect generation via on the fly electron spin resonance

Jason T. Ryan, Patrick M. Lenahan, Tibor Grasser, +1

Applied Physics Letters

SpintronicsMagnetismSpin DynamicEngineeringPhysics +13

Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation

Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer, +8

IEEE Transactions on Electron Devices

Device ModelingElectrical EngineeringHot-carrier DegradationEngineeringPhysics +12

Toward Automated Defect Extraction From Bias Temperature Instability Measurements

Dominic Waldhoer, Christian Schleich, Jakob Michl, +5

IEEE Transactions on Electron Devices

EngineeringMeasurementEducationDefect ToleranceReliability Engineering +21

Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images

J. Smoliner, B. Basnar, S. Golka, +4

Applied Physics Letters

EngineeringMicroscopyBias-dependent ContrastMicroscopy MethodNanoelectronics +14

Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl, +5

Device ModelingElectrical EngineeringHot-carrier DegradationEngineeringStress-induced Leakage Current +10

A 120V 180nm High Voltage CMOS smart power technology for system-on-chip integration

Rainer Minixhofer, N. Feilchenfeld, M. Knaipp, +16

International Symposium on Power Semiconductor Devices and IC's

Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignHigh Voltage Engineering +11

Hot-carrier degradation caused interface state profile—Simulation versus experiment

Ivan A. Starkov, Stanislav Tyaginov, H. Enichlmair, +6

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Electrical EngineeringHot-carrier DegradationEngineeringCrystalline DefectsPhysics +8

Quantitative scanning capacitance spectroscopy

W. Brezna, M. Schramboeck, Alois Lugstein, +5

Applied Physics Letters

EngineeringMicroscopyElectron MicroscopyNanometrologyInstrumentation +15