Publication | Closed Access
Electromigration in submicron interconnect features of integrated circuits
90
Citations
83
References
2010
Year
Electrical EngineeringElectromigration TechniqueEngineeringAdvanced Packaging (Semiconductors)NanoelectronicsSubmicron Interconnect FeaturesIntegrated CircuitsElectronic PackagingMicroelectronicsInterconnect (Integrated Circuits)
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|---|---|---|
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