Solid-State Electronics · 2015 · 55 citations · 20 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationLambert's ProblemMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsCompact Model Parameter ExtractionGate-dependent Current-voltage BehaviorMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingSmall-signal Parameter Extraction
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New method for the extraction of MOSFET parameters
G. Ghibaudo · Electronics Letters · 1988 · 831 citations
14nm FDSOI technology for high speed and energy efficient applications
O. Weber, E. Josse, F. Andrieu et al. · 2014 · 89 citations
Engineering, Computer Engineering, Electrical Engineering +15