Small-Signal Parameter Extraction is a methodological framework in electrical engineering for determining linearized device parameters under small-signal operating conditions, distinguished by its focus on deriving incremental response characteristics from nonlinear systems through perturbation analysis around a bias point.
250
Publications
8.3K
Citations
716
Authors
296
Institutions
Publications per year
2017–2026
41
Parents
Publications
250
1–5 of 250
Authors
716
- GGG. Ghibaudo
Institut de Microélectronique, Electromagnétisme et Photonique, France
8 publications · 381 citations
8
h-index
- PT
7
h-index
- FM
7
h-index
- AO
6
h-index
- GK
6
h-index
1–5 of 716
Institutions
296
Centre National de la Recherche Scientifique
Paris, France
9 h-index
20 publications
620 citations
University of Calgary
Calgary, Canada
8 h-index
15 publications
466 citations
Institut de Microélectronique, Electromagnétisme et Photonique
Grenoble, France
6 h-index
19 publications
1K citations
Tsinghua University
Beijing, China
6 h-index
16 publications
382 citations
Cardiff University
Cardiff, United Kingdom
6 h-index
18 publications
503 citations
Simón Bolívar University
Caracas, Venezuela
6 h-index
12 publications
353 citations
Université Grenoble Alpes
Saint-Martin-d'Hères, France
6 h-index
22 publications
1.3K citations
Institut polytechnique de Grenoble
Grenoble, France
6 h-index
22 publications
1.3K citations
1–8 of 296
Venues
- IEEE Transactions on Microwave Theory and Techniques
33 publications · 1.9K citations
22
h-index
- Solid-State Electronics
15 publications · 707 citations
14
h-index
- IEEE Transactions on Electron Devices
13 publications · 919 citations
13
h-index
- Microelectronics Reliability
7 publications · 162 citations
7
h-index
- Electronics Letters
6 publications · 181 citations
6
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1–5