Gate-dependent Current-voltage Behavior

Gate-Dependent Current-Voltage Behavior is a semiconductor device characteristic that describes the variation in current-voltage relationships as a function of applied gate voltage, distinguishing it from fixed-bias current-voltage behaviors by explicitly capturing the modulation of carrier transport through the gate-controlled electric field in field-effect devices.

1.1K

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43.3K

Citations

3.8K

Authors

811

Institutions

Publications per year

2017–2026

196

Authors

3.8K

  1. MS
    M. S. Shur

    Rensselaer Polytechnic Institute, United States

    24 publications · 1.7K citations

    20

    h-index

  2. BJ
    B. Jayant Baliga

    North Carolina State University, United States

    13 publications · 365 citations

    13

    h-index

  3. GG
    G. Ghibaudo

    Institut de Microélectronique, Electromagnétisme et Photonique, France

    13 publications · 316 citations

    12

    h-index

  4. DF
    Denis Flandre

    UCLouvain, Belgium

    12 publications · 411 citations

    11

    h-index

  5. KJ
    Kevin J. Chen

    Hong Kong University of Science and Technology, Hong Kong SAR China

    11 publications · 501 citations

    11

    h-index

1–5 of 3.8K

Venues

  1. IEEE Transactions on Electron Devices

    152 publications · 7.7K citations

    46

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  2. IEEE Electron Device Letters

    102 publications · 5.9K citations

    44

    h-index

  3. Applied Physics Letters

    72 publications · 5.7K citations

    33

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  4. Solid-State Electronics

    98 publications · 3.3K citations

    32

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  5. Japanese Journal of Applied Physics

    JJAP · 43 publications · 1.3K citations

    19

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1–5