E.G. Ioannidis

Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs

E.G. Ioannidis, C.A. Dimitriadis, S. Haendler et al. · Solid-State Electronics · 2012 · 63 citations

Device Modeling, Electrical Engineering, Engineering +8

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

T.A. Karatsori, Christoforos Theodorou, E.G. Ioannidis et al. · Solid-State Electronics · 2015 · 53 citations

Device Modeling, Electrical Engineering, Engineering +2

Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs

Christoforos Theodorou, E.G. Ioannidis, F. Andrieu et al. · IEEE Transactions on Electron Devices · 2014 · 51 citations

Electrical Engineering, Semiconductor Device, Engineering +15

Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

E.G. Ioannidis, S. Haendler, A. Bajolet et al. · 2011 · 45 citations

Electrical Engineering, Fd-soi Cmos Transistors, Bulk Cmos Technologies +12

Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise

E.G. Ioannidis, A. Tsormpatzoglou, D.H. Tassis et al. · Journal of Applied Physics · 2010 · 43 citations

Electrical Engineering, H Tfts, Engineering +12