A. Bajolet

28nm FDSOI technology platform for high-speed low-voltage digital applications

N. Planes, O. Weber, V. Barral et al. · 2012 · 424 citations

Engineering, Computer Engineering, Electrical Engineering +16

Efficient multi-V<inf>T</inf> FDSOI technology with UTBOX for low power circuit design

C. Fenouillet-Béranger, Olivier Thomas, P. Perreau et al. · 2010 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +8

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

D. Angot, V. Huard, Lama Rahhal et al. · 2013 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Simulation Study of Dominant Statistical Variability Sources in 32-nm High- $\kappa$/Metal Gate CMOS

Xingsheng Wang, Gareth Roy, O. Saxod et al. · IEEE Electron Device Letters · 2012 · 55 citations

Engineering, Computer Engineering, Electrical Engineering +17

Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

E.G. Ioannidis, S. Haendler, A. Bajolet et al. · 2011 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17