Christoforos Theodorou

Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications

Bruna Cardoso Paz, M. Cassé, Christoforos Theodorou et al. · IEEE Transactions on Electron Devices · 2020 · 59 citations · Full text

Engineering, Vlsi Design, Back Bias Impact +17

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

T.A. Karatsori, Christoforos Theodorou, E.G. Ioannidis et al. · Solid-State Electronics · 2015 · 53 citations

Device Modeling, Electrical Engineering, Engineering +2

Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs

Christoforos Theodorou, E.G. Ioannidis, F. Andrieu et al. · IEEE Transactions on Electron Devices · 2014 · 51 citations

Electrical Engineering, Semiconductor Device, Engineering +15

Origin of Low-Frequency Noise in the Low Drain Current Range of Bottom-Gate Amorphous IGZO Thin-Film Transistors

Christoforos Theodorou, A. Tsormpatzoglou, C.A. Dimitriadis et al. · IEEE Electron Device Letters · 2011 · 41 citations

Semiconductor Technology, Electrical Engineering, Engineering +10

Comparison for 1/ ${f}$ Noise Characteristics of AlGaN/GaN FinFET and Planar MISHFET

Sindhuri Vodapally, Christoforos Theodorou, Young-Ho Bae et al. · IEEE Transactions on Electron Devices · 2017 · 38 citations

Noise Characteristics, Wide-bandgap Semiconductor, Electrical Engineering +12